Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

Koleksi

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
24.21.1349 - Xiaowei Li, Guihai Yan, Cheng Liu
24.21.1349-1
Sedang Diproses
06 November 2024

Informasi Koleksi

31
Beli
Logistik Telkom University
 
Buku - Elektronik (E-Book)
Tel-U Gedung Manterawu Lantai 5